Achintya Halder, Abhijit Chatterjee. Test generation for specification test of analog circuits using efficient test response observation methods. Microelectronics Journal, 36(9):820-832, 2005. [doi]
@article{HalderC05,
title = {Test generation for specification test of analog circuits using efficient test response observation methods},
author = {Achintya Halder and Abhijit Chatterjee},
year = {2005},
doi = {10.1016/j.mejo.2005.03.005},
url = {http://dx.doi.org/10.1016/j.mejo.2005.03.005},
tags = {testing},
researchr = {https://researchr.org/publication/HalderC05},
cites = {0},
citedby = {0},
journal = {Microelectronics Journal},
volume = {36},
number = {9},
pages = {820-832},
}