Performance Reliability of Ge Nanosheet FETs for Gaussian Distribution Channel Incorporating Interface Trap for RF and Analog Application - researchr publication authors

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Anwesha Halder, Subir Kumar Maity, Manoj Kumar Dutta, Amit Banerjee, Vinay Gupta, Rudra Sankar Dhar. Performance Reliability of Ge Nanosheet FETs for Gaussian Distribution Channel Incorporating Interface Trap for RF and Analog Application. IEEE Access, 14:93209-93221, 2026. [doi]

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