Anwesha Halder, Subir Kumar Maity, Manoj Kumar Dutta, Amit Banerjee, Vinay Gupta, Rudra Sankar Dhar. Performance Reliability of Ge Nanosheet FETs for Gaussian Distribution Channel Incorporating Interface Trap for RF and Analog Application. IEEE Access, 14:93209-93221, 2026. [doi]
@article{HalderMDBGD26,
title = {Performance Reliability of Ge Nanosheet FETs for Gaussian Distribution Channel Incorporating Interface Trap for RF and Analog Application},
author = {Anwesha Halder and Subir Kumar Maity and Manoj Kumar Dutta and Amit Banerjee and Vinay Gupta and Rudra Sankar Dhar},
year = {2026},
doi = {10.1109/ACCESS.2026.3705225},
url = {https://doi.org/10.1109/ACCESS.2026.3705225},
researchr = {https://researchr.org/publication/HalderMDBGD26},
cites = {0},
citedby = {0},
journal = {IEEE Access},
volume = {14},
pages = {93209-93221},
}