Abdelghafour Halimi, Hadj Batatia, Jimmy le Digabel, Gwendal Josse, Jean-Yves Tourneret. Statistical modeling and classification of reflectance confocal microscopy images. In 2017 IEEE 7th International Workshop on Computational Advances in Multi-Sensor Adaptive Processing, CAMSAP 2017, Curaçao, The Netherlands, December 10-13, 2017. pages 1-5, IEEE, 2017. [doi]
Abstract is missing.