B. D. Hall. An opportunity to enhance the value of metrological traceability in digital systems. In 2nd Workshop on Metrology for Industry 4.0 and IoT MetroInd4.0&IoT 2019, Naples, Italy, June 4-6, 2019. pages 16-21, IEEE, 2019. [doi]
@inproceedings{Hall19-1, title = {An opportunity to enhance the value of metrological traceability in digital systems}, author = {B. D. Hall}, year = {2019}, doi = {10.1109/METROI4.2019.8792841}, url = {https://doi.org/10.1109/METROI4.2019.8792841}, researchr = {https://researchr.org/publication/Hall19-1}, cites = {0}, citedby = {0}, pages = {16-21}, booktitle = {2nd Workshop on Metrology for Industry 4.0 and IoT MetroInd4.0&IoT 2019, Naples, Italy, June 4-6, 2019}, publisher = {IEEE}, isbn = {978-1-7281-0429-4}, }