An opportunity to enhance the value of metrological traceability in digital systems

B. D. Hall. An opportunity to enhance the value of metrological traceability in digital systems. In 2nd Workshop on Metrology for Industry 4.0 and IoT MetroInd4.0&IoT 2019, Naples, Italy, June 4-6, 2019. pages 16-21, IEEE, 2019. [doi]

Abstract

Abstract is missing.