Prototype Testing Simplified by Scannable Buffers and Latches

Andy Halliday, Greg Young, Alfred L. Crouch. Prototype Testing Simplified by Scannable Buffers and Latches. In Proceedings International Test Conference 1989, Washington, D.C., USA, August 1989. pages 174-181, IEEE Computer Society, 1989.

Authors

Andy Halliday

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Greg Young

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Alfred L. Crouch

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