Andy Halliday, Greg Young, Alfred L. Crouch. Prototype Testing Simplified by Scannable Buffers and Latches. In Proceedings International Test Conference 1989, Washington, D.C., USA, August 1989. pages 174-181, IEEE Computer Society, 1989.
@inproceedings{HallidayYC89,
title = {Prototype Testing Simplified by Scannable Buffers and Latches},
author = {Andy Halliday and Greg Young and Alfred L. Crouch},
year = {1989},
tags = {testing},
researchr = {https://researchr.org/publication/HallidayYC89},
cites = {0},
citedby = {0},
pages = {174-181},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C., USA, August 1989},
publisher = {IEEE Computer Society},
}