Graph Discovery for Visual Test Generation

Neil Hallonquist, Donald Geman, Laurent Younes. Graph Discovery for Visual Test Generation. In 25th International Conference on Pattern Recognition, ICPR 2020, Virtual Event / Milan, Italy, January 10-15, 2021. pages 7500-7507, IEEE, 2020. [doi]

Authors

Neil Hallonquist

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Donald Geman

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Laurent Younes

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