Neil Hallonquist, Donald Geman, Laurent Younes. Graph Discovery for Visual Test Generation. In 25th International Conference on Pattern Recognition, ICPR 2020, Virtual Event / Milan, Italy, January 10-15, 2021. pages 7500-7507, IEEE, 2020. [doi]
@inproceedings{HallonquistGY20, title = {Graph Discovery for Visual Test Generation}, author = {Neil Hallonquist and Donald Geman and Laurent Younes}, year = {2020}, doi = {10.1109/ICPR48806.2021.9412848}, url = {https://doi.org/10.1109/ICPR48806.2021.9412848}, researchr = {https://researchr.org/publication/HallonquistGY20}, cites = {0}, citedby = {0}, pages = {7500-7507}, booktitle = {25th International Conference on Pattern Recognition, ICPR 2020, Virtual Event / Milan, Italy, January 10-15, 2021}, publisher = {IEEE}, isbn = {978-1-7281-8808-9}, }