Hyperspectral imaging as an analytical tool for thin single and multilayer oxides characterization: A laboratory study

Shu Hui Ham, Morgan Ferie, Cédric Carteret, Gabriel Fricout, Jesús Angulo, Fabien Capon. Hyperspectral imaging as an analytical tool for thin single and multilayer oxides characterization: A laboratory study. In 8th Workshop on Hyperspectral Image and Signal Processing: Evolution in Remote Sensing, WHISPERS 2016, Los Angeles, CA, USA, August 21-24, 2016. pages 1-5, IEEE, 2016. [doi]

Abstract

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