Investigation of Time Evolution of Length of Break Arcs Occurring in a 48VDC/50-300A Resistive Circuit

Kenshi Hamamoto, Junya Sekikawa. Investigation of Time Evolution of Length of Break Arcs Occurring in a 48VDC/50-300A Resistive Circuit. IEICE Transactions, 102-C(5):424-427, 2019. [doi]

Abstract

Abstract is missing.