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Advanced embedded memory testing: Reducing the defect per million level at lower test cost

Said Hamdioui, A. J. van de Goor. Advanced embedded memory testing: Reducing the defect per million level at lower test cost. In Elena Gramatová, Zdenek Kotásek, Andreas Steininger, Heinrich Theodor Vierhaus, Horst Zimmermann, editors, 13th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2010, Vienna, Austria, April 14-16, 2010. pages 7, IEEE, 2010. [doi]

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Said Hamdioui

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A. J. van de Goor

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