Consequences of port restrictions on testing two-port memories

Said Hamdioui, A. J. van de Goor. Consequences of port restrictions on testing two-port memories. In Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998. pages 63-72, IEEE Computer Society, 1998. [doi]

Authors

Said Hamdioui

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A. J. van de Goor

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