Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Naim Ben Hamida, Bozena Kaminska. Multiple fault analog circuit testing by sensitivity analysis. J. Electronic Testing, 4(4):331-343, 1993. [doi]
No references recorded for this publication.
No citations of this publication recorded.