Joint CS Measurement Through Coherent MAC: Exploiting Joint Sparsity of Multiple Phenomena

Chengcheng Han 0002, Li Chen 0015, Weidong Wang. Joint CS Measurement Through Coherent MAC: Exploiting Joint Sparsity of Multiple Phenomena. IEEE T. Vehicular Technology, 71(1):583-594, 2022. [doi]

Abstract

Abstract is missing.