Jizhou Han, Chenhao Ding, Songlin Dong, Xinyuan Gao, Qiang Wang, Yuhang He 0001, Yihong Gong. Unleashing the Potential of All Test Samples: Mean-Shift Guided Test-Time Adaptation. IEEE Trans. Circuits Syst. Video Techn., 36(8):11323-11335, August 2026. [doi]
Abstract is missing.