Jeong Han, Norman Kim, Bong-Jin Yum, Myong K. Jeong. Pattern selection approaches for the logical analysis of data considering the outliers and the coverage of a pattern. Expert Syst. Appl., 38(11):13857-13862, 2011. [doi]
@article{HanKYJ11,
title = {Pattern selection approaches for the logical analysis of data considering the outliers and the coverage of a pattern},
author = {Jeong Han and Norman Kim and Bong-Jin Yum and Myong K. Jeong},
year = {2011},
doi = {10.1016/j.eswa.2011.04.189},
url = {http://dx.doi.org/10.1016/j.eswa.2011.04.189},
tags = {analysis, data-flow, data-flow analysis, coverage, systematic-approach},
researchr = {https://researchr.org/publication/HanKYJ11},
cites = {0},
citedby = {0},
journal = {Expert Syst. Appl.},
volume = {38},
number = {11},
pages = {13857-13862},
}