2.7 A coefficient-error-robust FFE TX with 230% eye-variation improvement without calibration in 65nm CMOS technology - researchr publication authors

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Seungho Han, Sooeun Lee, Minsoo Choi, Jae-Yoon Sim, Hong June Park, Byungsub Kim. 2.7 A coefficient-error-robust FFE TX with 230% eye-variation improvement without calibration in 65nm CMOS technology. In 2014 IEEE International Conference on Solid-State Circuits Conference, ISSCC 2014, Digest of Technical Papers, San Francisco, CA, USA, February 9-13, 2014. pages 50-51, IEEE, 2014. [doi]

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