Ming-Hung Han, Yiming Li, Chih-Hong Hwang. The impact of high-frequency characteristics induced by intrinsic parameter fluctuations in nano-MOSFET device and circuit. Microelectronics Reliability, 50(5):657-661, 2010. [doi]
@article{HanLH10,
title = {The impact of high-frequency characteristics induced by intrinsic parameter fluctuations in nano-MOSFET device and circuit},
author = {Ming-Hung Han and Yiming Li and Chih-Hong Hwang},
year = {2010},
doi = {10.1016/j.microrel.2010.01.048},
url = {http://dx.doi.org/10.1016/j.microrel.2010.01.048},
researchr = {https://researchr.org/publication/HanLH10},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {50},
number = {5},
pages = {657-661},
}