Youngshin Han, Chilgee Lee, Jason J. Jung. Redundancy analysis simulation in semiconductor manufacturing for yield improvement. In Gabriel Andrés Wainer, Clifford A. Shaffer, Robert M. McGraw, Michael J. Chinni, editors, Proceedings of the 2009 Spring Simulation Multiconference, SpringSim 2009, San Diego, California, USA, March 22-27, 2009. SCS/ACM, 2009. [doi]
Abstract is missing.