Single-Trace Attack on NIST Round 3 Candidate Dilithium Using Machine Learning-Based Profiling - researchr publication

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Jaeseung Han, Taeho Lee, Jihoon Kwon, Joohee Lee, Il-Ju Kim, Jihoon Cho, Dong-Guk Han, Bo-Yeon Sim. Single-Trace Attack on NIST Round 3 Candidate Dilithium Using Machine Learning-Based Profiling. IEEE Access, 9:166283-166292, 2021. [doi]

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