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Dynamic Trace Signal Selection for Post-Silicon Validation

Kihyuk Han, Joon-Sung Yang, Jacob A. Abraham. Dynamic Trace Signal Selection for Post-Silicon Validation. In 26th International Conference on VLSI Design and 12th International Conference on Embedded Systems, Pune, India, January 5-10, 2013. pages 302-307, IEEE, 2013. [doi]

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