CLARQ: A Dynamic ARQ Solution for Ultra-High Closed-Loop Reliability

Bin Han 0004, Yao Zhu 0001, Muxia Sun, Vincenzo Sciancalepore, Yulin Hu, Hans D. Schotten. CLARQ: A Dynamic ARQ Solution for Ultra-High Closed-Loop Reliability. IEEE Transactions on Wireless Communications, 21(1):280-294, 2022. [doi]

Abstract

Abstract is missing.