Christopher J. Hannaford. A Computer Architecture for High Pin Count Testers. In Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991. pages 1042-1048, IEEE Computer Society, 1991.
@inproceedings{Hannaford91,
title = {A Computer Architecture for High Pin Count Testers},
author = {Christopher J. Hannaford},
year = {1991},
tags = {architecture},
researchr = {https://researchr.org/publication/Hannaford91},
cites = {0},
citedby = {0},
pages = {1042-1048},
booktitle = {Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991},
publisher = {IEEE Computer Society},
isbn = {0-8186-9156-5},
}