Optimizing quantum efficiency in a stacked CMOS sensor

Rob Hannebauer, Sang Keun Yoo, David L. Gilblom, Alexander D. Gilblom. Optimizing quantum efficiency in a stacked CMOS sensor. In Ralf Widenhorn, Valérie Nguyen, editors, Sensors, Cameras, and Systems for Industrial, Scientific, and Consumer Applications XII, San Francisco Airport, California, USA, January 23-27, 2011. Volume 7875 of SPIE Proceedings, pages 787505, SPIE, 2011. [doi]

Abstract

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