Peter Hansen. Converting Device Test Vectors to an In-Circuit Board Test Environment. In Proceedings International Test Conference 1985, Philadelphia, PA, USA, November 1985. pages 972-979, IEEE Computer Society, 1985.
@inproceedings{Hansen85,
title = {Converting Device Test Vectors to an In-Circuit Board Test Environment},
author = {Peter Hansen},
year = {1985},
tags = {meta-model, testing, Meta-Environment, meta-objects},
researchr = {https://researchr.org/publication/Hansen85},
cites = {0},
citedby = {0},
pages = {972-979},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA, USA, November 1985},
publisher = {IEEE Computer Society},
}