Electromagnetic Metrology for Nano- Electromechanical Systems

Ling Hao, John C. Gallop, Jie Chen 0016. Electromagnetic Metrology for Nano- Electromechanical Systems. IEEE T. Instrumentation and Measurement, 68(6):1827-1832, 2019. [doi]

Authors

Ling Hao

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John C. Gallop

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Jie Chen 0016

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