Kelvin Bridge Structure Based TSV Test for Weak Faults

Chang Hao, Zhengfeng Huang, Tianming Ni. Kelvin Bridge Structure Based TSV Test for Weak Faults. In IEEE International Test Conference in Asia, ITC-Asia 2021, Shanghai, China, August 18-20, 2021. pages 1-6, IEEE, 2021. [doi]

Authors

Chang Hao

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Zhengfeng Huang

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Tianming Ni

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