Zhigang Hao, Ruijing Shen, Sheldon X.-D. Tan, Bao Liu, Guoyong Shi, Yici Cai. Statistical full-chip dynamic power estimation considering spatial correlations. In Proceedings of the 12th International Symposium on Quality Electronic Design, ISQED 2011, Santa Clara, California, USA, 14-16 March 2011. pages 677-682, IEEE, 2011. [doi]
@inproceedings{HaoSTLSC11,
title = {Statistical full-chip dynamic power estimation considering spatial correlations},
author = {Zhigang Hao and Ruijing Shen and Sheldon X.-D. Tan and Bao Liu and Guoyong Shi and Yici Cai},
year = {2011},
doi = {10.1109/ISQED.2011.5770802},
url = {http://dx.doi.org/10.1109/ISQED.2011.5770802},
researchr = {https://researchr.org/publication/HaoSTLSC11},
cites = {0},
citedby = {0},
pages = {677-682},
booktitle = {Proceedings of the 12th International Symposium on Quality Electronic Design, ISQED 2011, Santa Clara, California, USA, 14-16 March 2011},
publisher = {IEEE},
isbn = {978-1-61284-914-0},
}