Haiyang Hao, Kai Zhang, Steven X. Ding, Zhiwen Chen, Yaguo Lei, Zhikun Hu. A KPI-related multiplicative fault diagnosis scheme for industrial processes. In 10th IEEE International Conference on Control and Automation, ICCA 2013, Hangzhou, China, June 12-14, 2013. pages 1460-1465, IEEE, 2013. [doi]
Abstract is missing.