Defect-oriented cell-aware ATPG and fault simulation for industrial cell libraries and designs - researchr publication authors

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Friedrich Hapke, Rene Krenz-Baath, Andreas Glowatz, Jürgen Schlöffel, Hamidreza Hashempour, Stefan Eichenberger, Camelia Hora, Dan Adolfsson. Defect-oriented cell-aware ATPG and fault simulation for industrial cell libraries and designs. In Gordon W. Roberts, Bill Eklow, editors, 2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009. pages 1-10, IEEE, 2009. [doi]

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