Friedrich Hapke, Jürgen Schlöffel. Introduction to the defect-oriented cell-aware test methodology for significant reduction of DPPM rates. In 17th IEEE European Test Symposium, ETS 2012, May 28th - June 1st 2012, Annecy, France. pages 1-6, IEEE Computer Society, 2012. [doi]
@inproceedings{HapkeS12, title = {Introduction to the defect-oriented cell-aware test methodology for significant reduction of DPPM rates}, author = {Friedrich Hapke and Jürgen Schlöffel}, year = {2012}, doi = {10.1109/ETS.2012.6233046}, url = {http://dx.doi.org/10.1109/ETS.2012.6233046}, researchr = {https://researchr.org/publication/HapkeS12}, cites = {0}, citedby = {0}, pages = {1-6}, booktitle = {17th IEEE European Test Symposium, ETS 2012, May 28th - June 1st 2012, Annecy, France}, publisher = {IEEE Computer Society}, isbn = {978-1-4673-0697-3}, }