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False positive reduction for ground glass opacities in CT by feature analysis based on a multiple-region extraction technique

Minoru Harada, Shinji Mizuno, Hotaka Takizawa, Shinji Yamamoto, Tohru Matsumoto, Shusuke Sone, Fumiyoshi Takayama, Masahiro Koyama, Shinichi Wada. False positive reduction for ground glass opacities in CT by feature analysis based on a multiple-region extraction technique. In Michael W. Marcellin, editor, Signal and Image Processing (SIP 2005), Proceedings of the IASTED International Conference, August 15-17, 2005, Honolulu, HI, USA. pages 116-121, IASTED/ACTA Press, 2005.

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