Divakar Harekal, Jawahar J. Rao, V. Suma. Pattern Analysis of Post Production Defects in Software Industry. In Suresh Chandra Satapathy, Bhabendra Narayan Biswal, Siba K. Udgata, J. K. Mandal, editors, Proceedings of the 3rd International Conference on Frontiers of Intelligent Computing: Theory and Applications (FICTA) 2014 - Volume 2, Bhubaneswar, Odisa, India, 14-15 November 2014. Volume 328 of Advances in Intelligent Systems and Computing, pages 667-671, Springer, 2014. [doi]
Abstract is missing.