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Exact scalable sensitivity analysis for the next release problem

Mark Harman, Jens Krinke, Inmaculada Medina-Bulo, Francisco Palomo-Lozano, Jian Ren, Shin Yoo. Exact scalable sensitivity analysis for the next release problem. ACM Transactions on Software Engineering Methodology, 23(2):19, 2014. [doi]

Authors

Mark Harman

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Jens Krinke

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Inmaculada Medina-Bulo

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Francisco Palomo-Lozano

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Jian Ren

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Shin Yoo

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