Haidar Harmanani, Salam Harfoush. Test insertion at the RT level using functional test metrics. In Proceedings of the 2000 7th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2000, Jounieh, Lebanon, December 17-20, 2000. pages 1016-1020, IEEE, 2000. [doi]
@inproceedings{HarmananiH00,
title = {Test insertion at the RT level using functional test metrics},
author = {Haidar Harmanani and Salam Harfoush},
year = {2000},
doi = {10.1109/ICECS.2000.913048},
url = {https://doi.org/10.1109/ICECS.2000.913048},
researchr = {https://researchr.org/publication/HarmananiH00},
cites = {0},
citedby = {0},
pages = {1016-1020},
booktitle = {Proceedings of the 2000 7th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2000, Jounieh, Lebanon, December 17-20, 2000},
publisher = {IEEE},
isbn = {0-7803-6542-9},
}