Cost-efficient fault-tolerant decoder for hybrid nanoelectronic memories

Nor Zaidi Haron, Said Hamdioui. Cost-efficient fault-tolerant decoder for hybrid nanoelectronic memories. In Design, Automation and Test in Europe, DATE 2011, Grenoble, France, March 14-18, 2011. pages 265-268, IEEE, 2011. [doi]

@inproceedings{HaronH11-0,
  title = {Cost-efficient fault-tolerant decoder for hybrid nanoelectronic memories},
  author = {Nor Zaidi Haron and Said Hamdioui},
  year = {2011},
  url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5763271},
  researchr = {https://researchr.org/publication/HaronH11-0},
  cites = {0},
  citedby = {0},
  pages = {265-268},
  booktitle = {Design, Automation and Test in Europe, DATE 2011, Grenoble, France, March 14-18, 2011},
  publisher = {IEEE},
  isbn = {978-1-61284-208-0},
}