Ian G. Harris, Alex Orailoglu. Fine-Grained Concurrency in Test Scheduling for Partial-Intrusion BIST. In Robert Werner, editor, EDAC - The European Conference on Design Automation, ETC - European Test Conference, EUROASIC - The European Event in ASIC Design, Proceedings, February 28 - March 3, 1994, Paris, France. pages 119-123, IEEE Computer Society, 1994.
@inproceedings{HarrisO94,
title = {Fine-Grained Concurrency in Test Scheduling for Partial-Intrusion BIST},
author = {Ian G. Harris and Alex Orailoglu},
year = {1994},
tags = {testing},
researchr = {https://researchr.org/publication/HarrisO94},
cites = {0},
citedby = {0},
pages = {119-123},
booktitle = {EDAC - The European Conference on Design Automation, ETC - European Test Conference, EUROASIC - The European Event in ASIC Design, Proceedings, February 28 - March 3, 1994, Paris, France},
editor = {Robert Werner},
publisher = {IEEE Computer Society},
isbn = {0-8186-5410-4},
}