Frequentist nonparametric goodness-of-fit tests via marginal likelihood ratios

Jeffrey D. Hart, Taeryon Choi, Seongbaek Yi. Frequentist nonparametric goodness-of-fit tests via marginal likelihood ratios. Computational Statistics & Data Analysis, 96:120-132, 2016. [doi]

Authors

Jeffrey D. Hart

This author has not been identified. Look up 'Jeffrey D. Hart' in Google

Taeryon Choi

This author has not been identified. Look up 'Taeryon Choi' in Google

Seongbaek Yi

This author has not been identified. Look up 'Seongbaek Yi' in Google