Jeffrey D. Hart, Taeryon Choi, Seongbaek Yi. Frequentist nonparametric goodness-of-fit tests via marginal likelihood ratios. Computational Statistics & Data Analysis, 96:120-132, 2016. [doi]
@article{HartCY16,
title = {Frequentist nonparametric goodness-of-fit tests via marginal likelihood ratios},
author = {Jeffrey D. Hart and Taeryon Choi and Seongbaek Yi},
year = {2016},
doi = {10.1016/j.csda.2015.10.013},
url = {http://dx.doi.org/10.1016/j.csda.2015.10.013},
researchr = {https://researchr.org/publication/HartCY16},
cites = {0},
citedby = {0},
journal = {Computational Statistics & Data Analysis},
volume = {96},
pages = {120-132},
}