Ismed Hartanto, Vamsi Boppana, Janak H. Patel, W. Kent Fuchs. Diagnostic Test Pattern Generation for Sequential Circuits. In 15th IEEE VLSI Test Symposium (VTS 97), April 27-May 1, 1997, Monterey, California, USA. pages 196-202, IEEE Computer Society, 1997. [doi]
Abstract is missing.