Gurgen Harutunyan, Yervant Zorian. An effective embedded test & diagnosis solution for external memories. In 21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015. pages 168-170, IEEE, 2015. [doi]
@inproceedings{HarutunyanZ15,
title = {An effective embedded test & diagnosis solution for external memories},
author = {Gurgen Harutunyan and Yervant Zorian},
year = {2015},
doi = {10.1109/IOLTS.2015.7229852},
url = {http://dx.doi.org/10.1109/IOLTS.2015.7229852},
researchr = {https://researchr.org/publication/HarutunyanZ15},
cites = {0},
citedby = {0},
pages = {168-170},
booktitle = {21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015},
publisher = {IEEE},
isbn = {978-1-4673-7905-2},
}