Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian. A New Method for March Test Algorithm Generation and Its Application for Fault Detection in RAMs. IEEE Trans. on CAD of Integrated Circuits and Systems, 31(6):941-949, 2012. [doi]
@article{HarutyunyanSVZ12,
title = {A New Method for March Test Algorithm Generation and Its Application for Fault Detection in RAMs},
author = {Gurgen Harutyunyan and Samvel K. Shoukourian and Valery A. Vardanian and Yervant Zorian},
year = {2012},
doi = {10.1109/TCAD.2012.2184107},
url = {http://dx.doi.org/10.1109/TCAD.2012.2184107},
researchr = {https://researchr.org/publication/HarutyunyanSVZ12},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {31},
number = {6},
pages = {941-949},
}