Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian. Extending fault periodicity table for testing faults in memories under 20nm. In 2014 East-West Design & Test Symposium, EWDTS 2014, Kiev, Ukraine, September 26-29, 2014. pages 1-4, IEEE Computer Society, 2014. [doi]
Abstract is missing.