J. Haruyama, K. Takazawa, S. Miyadai, A. Takeda, N. Hori, I. Takesue, Y. Kanda, N. Sugiyama. Proximity-induced superconductivity and its re-entrance effect in niobium/multi-walled carbon nanotube junctions. Microelectronics Journal, 34(5-8):537-539, 2003. [doi]
@article{HaruyamaTMTHTKS03,
title = {Proximity-induced superconductivity and its re-entrance effect in niobium/multi-walled carbon nanotube junctions},
author = {J. Haruyama and K. Takazawa and S. Miyadai and A. Takeda and N. Hori and I. Takesue and Y. Kanda and N. Sugiyama},
year = {2003},
doi = {10.1016/S0026-2692(03)00042-9},
url = {http://dx.doi.org/10.1016/S0026-2692(03)00042-9},
researchr = {https://researchr.org/publication/HaruyamaTMTHTKS03},
cites = {0},
citedby = {0},
journal = {Microelectronics Journal},
volume = {34},
number = {5-8},
pages = {537-539},
}