Kento Hasegawa, Masao Yanagisawa, Nozomu Togawa. Detecting the Existence of Malfunctions in Microcontrollers Utilizing Power Analysis. In Dimitris Gizopoulos, Dan Alexandrescu, Mihalis Maniatakos, Panagiota Papavramidou, editors, 24th IEEE International Symposium on On-Line Testing And Robust System Design, IOLTS 2018, Platja D'Aro, Spain, July 2-4, 2018. pages 97-102, IEEE, 2018. [doi]
@inproceedings{HasegawaYT18-1,
title = {Detecting the Existence of Malfunctions in Microcontrollers Utilizing Power Analysis},
author = {Kento Hasegawa and Masao Yanagisawa and Nozomu Togawa},
year = {2018},
doi = {10.1109/IOLTS.2018.8474113},
url = {https://doi.org/10.1109/IOLTS.2018.8474113},
researchr = {https://researchr.org/publication/HasegawaYT18-1},
cites = {0},
citedby = {0},
pages = {97-102},
booktitle = {24th IEEE International Symposium on On-Line Testing And Robust System Design, IOLTS 2018, Platja D'Aro, Spain, July 2-4, 2018},
editor = {Dimitris Gizopoulos and Dan Alexandrescu and Mihalis Maniatakos and Panagiota Papavramidou},
publisher = {IEEE},
isbn = {978-1-5386-5992-2},
}