Nikolaus Haselgruber, Shawn P. Capser, Giorgio I. Vignati. Early life reliability growth testing with non-constant failure intensity. In Francesco Longo 0002, Michael Affenzeller, Antonio Padovano, editors, Proceedings of the 2nd International Conference on Industry 4.0 and Smart Manufacturing (ISM 2020), Virtual Event, Austria, 23-25 November 2020. Volume 180 of Procedia Computer Science, pages 608-617, Elsevier, 2020. [doi]
Abstract is missing.