Observation of the internal waveforms in high-speed high-density LSIs using an EOS prober

Chisato Hashimoto, Takamitsu Takizawa, Sigeru Nakajima, Mitsuru Shinagawa, Tadao Nagatsuma. Observation of the internal waveforms in high-speed high-density LSIs using an EOS prober. Microelectronics Reliability, 41(8):1203-1209, 2001. [doi]

Authors

Chisato Hashimoto

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Takamitsu Takizawa

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Sigeru Nakajima

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Mitsuru Shinagawa

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Tadao Nagatsuma

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