Chisato Hashimoto, Takamitsu Takizawa, Sigeru Nakajima, Mitsuru Shinagawa, Tadao Nagatsuma. Observation of the internal waveforms in high-speed high-density LSIs using an EOS prober. Microelectronics Reliability, 41(8):1203-1209, 2001. [doi]
Abstract is missing.